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1

High speed implementation of a three-dimensional shape profiler with submillimeter precision using a digital light processing device and a new efficient algorithm for absolute phase retrieval

Leong-Hoï, Audrey, Montgomery, Paul C., Serio, Bruno, Twardowski, Patrice

Journal:

Optical Engineering

Year:

2015

Language:

english

File:

PDF, 4.22 MB

english, 2015

2

[IEEE 2016 International Conference on Instrumentation, Control and Automation (ICA) - Bandung, Indonesia (2016.8.29-2016.8.31)] 2016 International Conference on Instrumentation, Control and Automation (ICA) - Study of robustness of 2D fringe processing in coherence scanning interferometry for the characterization of a transparent polymer film

Gianto, G., Montgomery, P., Salzenstein, F., Leong-Hoi, A.

Year:

2016

Language:

english

File:

PDF, 733 KB

english, 2016

3

SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 14 April 2014)] Optical Micro- and Nanometrology V - Three-dimensional surface reconstruction by combining a pico-digital projector for structured light illumination and an imaging system with high magnification and high depth of field

Gorecki, Christophe, Asundi, Anand K., Osten, Wolfgang, Leong-Hoï, A., Serio, B., Twardowski, P., Montgomery, P.

Year:

2014

Language:

english

File:

PDF, 549 KB

english, 2014

4

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Videometrics, Range Imaging, and Applications XIII - Detection of defects in a transparent polymer with high resolution tomography using white light scanning interferometry and noise reduction

Remondino, Fabio, Shortis, Mark R., Leong-Hoï, A., Claveau, R., Flury, M., Uhring, W., Serio, B., Anstotz, F., Montgomery, P. C.

Year:

2015

Language:

english

File:

PDF, 950 KB

english, 2015

5

High-dynamic-range microscope imaging based on exposure bracketing in full-field optical coherence tomography

Leong-Hoi, Audrey, Montgomery, Paul C., Serio, Bruno, Twardowski, Patrice, Uhring, Wilfried

Journal:

Year:

2016

Language:

english

File:

PDF, 1.63 MB

english, 2016

6

SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Sunday 3 April 2016)] Optical Micro- and Nanometrology VI - Overview of label-free far field optical nanoscopy techniques for nanometrology

Gorecki, Christophe, Asundi, Anand K., Osten, Wolfgang, Montgomery, Paul, Leong-Hoï, Audrey, Anstotz, Freddy, Liu, Hui, Simon, Bertrand, Debailleul, Matthieu, Haeberlé, Olivier

Year:

2016

Language:

english

File:

PDF, 2.56 MB

english, 2016

7

SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Sunday 3 April 2016)] Optical Micro- and Nanometrology VI - High-resolution full-field optical coherence tomography using high dynamic range image processing

Gorecki, Christophe, Asundi, Anand K., Osten, Wolfgang, Leong-Hoï, A., Claveau, R., Montgomery, P. C., Serio, B., Uhring, W., Anstotz, F., Flury, M.

Year:

2016

Language:

english

File:

PDF, 1.27 MB

english, 2016

8

From superresolution to nanodetection: overview of far field optical nanoscopy techniques for nanostructures

Montgomery, P C, Leong-Hoi, A, Anstotz, F, Mitev, D, Pramatarova, L, Haeberlé, O

Journal:

Journal of Physics Conference Series

Year:

2016

Language:

english

File:

PDF, 1.03 MB

english, 2016

9

Optical nanoscopy characterization of nanofilms

Montgomery, P C, Chapuis, P, Leong-Hoï, A, Anstotz, F, Rubin, A, Baschnagel, J, Gauthier, C, Reiter, G, McKenna, G B

Journal:

Journal of Physics Conference Series

Year:

2017

Language:

english

File:

PDF, 1.42 MB

english, 2017

10

Precise femtosecond laser ablation of dental hard tissue: preliminary investigation on adequate laser parameters

Hikov, Todor, Pecheva, Emilia, Montgomery, Paul, Antoni, Frederic, Leong-Hoi, Audrey, Petrov, Todor

Journal:

Journal of Physics Conference Series

Year:

2017

Language:

english

File:

PDF, 1021 KB

english, 2017

11

3D nano surface profilometry by combining the photonic nanojet with interferometry

Montgomery, P C, Lecler, S, Leong-Hoï, A, Pfeiffer, P

Journal:

Journal of Physics Conference Series

Year:

2017

Language:

english

File:

PDF, 2.09 MB

english, 2017

12

3D Super-Resolution Optical Profiling Using Microsphere Enhanced Mirau Interferometry

Kassamakov, Ivan, Lecler, Sylvain, Nolvi, Anton, Leong-Hoï, Audrey, Montgomery, Paul, Hæggström, Edward

Journal:

Scientific Reports

Year:

2017

Language:

english

File:

PDF, 2.33 MB

english, 2017

13

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Modeling Aspects in Optical Metrology VI - Role of coherence in microsphere-assisted nanoscopy

Bodermann, Bernd, Frenner, Karsten, Silver, Richard M., Perrin, Stephane, Lecler, Sylvain, Leong-Hoi, Audrey, Montgomery, Paul C.

Year:

2017

Language:

english

File:

PDF, 1.50 MB

english, 2017

14

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - Sub-diffraction surface topography measurement using a microsphere-assisted Linnik interferometer

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Montgomery, Paul C., Lecler, Sylvain, Leong-Hoï, Audrey, Perrin, Stéphane, Pfeiffer, Pierre

Year:

2017

Language:

english

File:

PDF, 1.14 MB

english, 2017

15

A novel interferometric method for the study of the viscoelastic properties of ultra-thin polymer films determined from nanobubble inflation

Chapuis, P., Montgomery, P. C., Anstotz, F., Leong-Hoï, A., Gauthier, C., Baschnagel, J., Reiter, G., McKenna, G. B., Rubin, A.

Journal:

Review of Scientific Instruments

Year:

2017

Language:

english

File:

PDF, 11.40 MB

english, 2017

16

Improvement in measurements of hydroxyapatite layers by hybrid high dynamic range image processing in white-light interferometry

Leong-Hoi, Audrey, Montgomery, Paul C., Serio, Bruno, Uhring, Wilfried, Pecheva, Emilia

Journal:

Materials Today: Proceedings

Year:

2017

Language:

english

File:

PDF, 814 KB

english, 2017

17

High Resolution Microsphere-Assisted Interference Microscopy for 3D Characterization of Nanomaterials

Leong-Hoi, Audrey, Hairaye, Camille, Perrin, Stephane, Lecler, Sylvain, Pfeiffer, Pierre, Montgomery, Paul

Journal:

physica status solidi (a)

Year:

2017

Language:

english

File:

PDF, 1.58 MB

english, 2017

18

Microsphere-assisted phase-shifting profilometry

Perrin, Stephane, Leong-Hoï, Audrey, Lecler, Sylvain, Pfeiffer, Pierre, Kassamakov, Ivan, Nolvi, Anton, Hæggström, Edward, Montgomery, Paul

Journal:

Year:

2017

Language:

english

File:

PDF, 1.49 MB

english, 2017

19

Emerging optical nanoscopy techniques

Montgomery, Paul C., Leong-Hoi, Audrey

Journal:

Nanotechnology Science and Applications

Year:

2015

Language:

english

File:

PDF, 3.29 MB

english, 2015

20

Illumination conditions in microsphere-assisted microscopy

PERRIN, STEPHANE, LI, HONGYU, LEONG-HOI, AUDREY, LECLER, SYLVAIN, MONTGOMERY, PAUL

Journal:

Journal of Microscopy

Year:

2019

File:

PDF, 1.97 MB

2019

21

High Resolution Surface Metrology Using Microsphere-Assisted Interference Microscopy

Montgomery, Paul C., Lecler, Sylvain, Leong-Hoï, Audrey, Perrin, Stéphane

Journal:

physica status solidi (a)

Year:

2019

File:

PDF, 2.80 MB

2019

22

Photonic jet lens

Lecler, Sylvain, Perrin, Stephane, Leong-Hoi, Audrey, Montgomery, Paul

Journal:

Scientific Reports

Year:

2019

File:

PDF, 2.80 MB

2019

23

Photonic jet lens

Lecler, Sylvain, Perrin, Stephane, Leong-Hoi, Audrey, Montgomery, Paul

Journal:

Scientific Reports

Year:

2019

Language:

english

File:

PDF, 2.80 MB

english, 2019

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